Special issue on electron and optical beam testing of integrated circuits - proceedings of the second European Conference on Electron and Optical Beam Testing of Integrated Circuits, October 1-4, 1989, Duisburg, F.E.G
- Författare
- E. Wolfgang E. Kubalek European Conference on Electron and Optical Beam Testing of Integrated Circuits 1989) Duisburg :
- (Edited by E. Kubalek and E. Wolfgang.)
- Genre
- Konferenser, Ej skönlitteratur, Konferenspublikation
- Språk
- Engelska
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| 1990 | Nederländerna | 445 sidor. |